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M17

M17: Tomographic Inverse Problems and Applications

Tomography refers to a non-invasive imaging technique used in a wide range of applications, including medical imaging, non-destructive testing and material science. The underlying inverse problem is the extraction of the unknown object or its features from the tomographic data. This minisymposium addresses both theoretical and algorithmic aspects of inverse problems arising in tomography as well as their applications. We aim to bring together young and established researchers to provide a forum to discuss new ideas and developments in this field. 

Organizers:
Bernadette Hahn, Saarland University, Germany,  This email address is being protected from spambots. You need JavaScript enabled to view it.
E. Todd Quinto, Tufts University, USA,  This email address is being protected from spambots. You need JavaScript enabled to view it.

Invited Speakers

Matias Courdurier, Pontificia Universidad Catolica de Chile, Chile, This email address is being protected from spambots. You need JavaScript enabled to view it.
Reconstructing the source and attenuation in SPECT using ballisting and scattering measurements

Bastian von Harrach, Goethe University Frankfurt, Germany, This email address is being protected from spambots. You need JavaScript enabled to view it.
Detecting stochastic inclusions in electrical impedance tomography

Sean Holman, University of Manchester, United Kingdom, This email address is being protected from spambots. You need JavaScript enabled to view it.
Stability of the geodesic ray transform in the presence of caustics

Joonas Ilmavirta, University of Jyväskylä, Finland
Quantum mechanical tomography and neutrino oscillation

Alfred Louis, Saarland University, Germany, This email address is being protected from spambots. You need JavaScript enabled to view it.
Cone-Beam Feature Reconstruction

Francois Monard, University of Michigan, USA, This email address is being protected from spambots. You need JavaScript enabled to view it.
Efficient tensor tomography in fan-beam coordinates

Plamen Stefanov, Purdue University, USA, This email address is being protected from spambots. You need JavaScript enabled to view it.
Support theorems for the light ray transform

Steven Oeckl, Fraunhofer Institute for Integrated Circuits IIS, Germany, This email address is being protected from spambots. You need JavaScript enabled to view it.
Advances in Industrial CT